The talk will showcase the measurement capability associated with the 4-probe scanning tunnelling microscope (STM) for the research and applications of materials for quantum technologies, at scales ranging from several micrometres down to individual atoms. In particular, STM work carried out to verify the positional accuracy of Au ions implanted in graphene on silicon carbide with the Single Ion Multi‐species Positioning at Low Energy (SIMPLE) tool at Surrey University will be presented. The study identified the STM imaging method as a suitable means to investigate the implanted sites at the atomic scale and to provide metrological input associated with the deterministic positioning of single ions in technologically relevant substrates.